Title :
SiGe HBT TCAD Simulation Taking into Account Impact of Proton Radiation
Author :
Konstantin O. Petrosyants;Maxim V. Kozhukhov
Author_Institution :
Moscow Inst. of Electron. &
Abstract :
Performance degradation of SiGe HBT after proton radiation impact is investigated using Synopsys Sentaurus tool. A new model to account for the impact of proton irradiation on physical parameters (τ, S0, Nit) is included in the program. The method to account for the impact of proton radiation is based on additivity of the ionization and displacement effects. Comparison of simulated and experimental characteristics of SiGe HBT after subjection to proton fluences up to 5·1013 p/cm2 shows the 10-20% error.
Keywords :
"Protons","Silicon germanium","Radiation effects","Heterojunction bipolar transistors","Mathematical model","Ionization","Neutrons"
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN :
978-1-5090-0232-0
DOI :
10.1109/RADECS.2015.7365666