DocumentCode :
3718592
Title :
Simulation of Proton Induced SET in Linear Devices and Assessment of Sensitive Thicknesses
Author :
Cecile Weulersse;Sebastien Morand;Florent Miller;Thierry Carriere;Renaud Mangeret
Author_Institution :
Airbus Group Innovations, Toulouse, France
fYear :
2015
Firstpage :
1
Lastpage :
4
Abstract :
This study aims to accurately determine analog SET proton cross sections derived from heavy ion data using gateway tools such as METIS, SIMPA or the more recent METIS approach we developed within Airbus Group. We validate the methodology on three linear devices and show promising results. Especially, METIS could be used in a reversed manner to determine the sensitive thickness based on the knowledge of both proton and heavy ion cross sections.
Keywords :
"Protons","Single event transients","Transient analysis","Sensitivity","Data models","Single event upsets","Monte Carlo methods"
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN :
978-1-5090-0232-0
Type :
conf
DOI :
10.1109/RADECS.2015.7365668
Filename :
7365668
Link To Document :
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