Title :
Statistical Anomalies of Bitflips in SRAMs to Discriminate MCUs from SEUs
Author :
Juan Antonio Clemente;Francisco J. Franco;Francesca Villa;Maud Baylac;Solenne Rey;Hortensia Mecha;Juan A. Agapito;Helmut Puchner;Guillaume Hubert;Raoul Velazco
Author_Institution :
Comput. Archit. Dept., Univ. Complutense de Madrid, Madrid, Spain
Abstract :
This paper presentes an approach to discern MCUs from SEUs in SRAM memories. Experiments involving radiation tests with 14-MeV neutrons on two successive generations (130 and 90 nm) of Cypress devices are presented.
Keywords :
"Neutrons","Electronic mail","Random access memory","Computer architecture","Microprocessors","Radiation effects","Single event upsets"
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN :
978-1-5090-0232-0
DOI :
10.1109/RADECS.2015.7365670
