Title :
The Critical Elements of the Modern Transceiver ICs upon Space Radiation Exposure
Author :
G. G. Davydov;A. S. Kolosova;D. V. Boychenko;A. A. Pechenkin
Author_Institution :
Moscow Eng. Phys. Inst., Nat. Res. Nucl. Univ. MEPhI, Moscow, Russia
Abstract :
As a result of analyzing more than 60 types of the modern transceivers ICs, the most sensitive functional units and the critical operation modes upon exposure the space radiation (especifically, TID and SEE effects) were identified.
Keywords :
"Transceivers","Receivers","Integrated circuits","Optical transmitters","Single event upsets","Crystals","Degradation"
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN :
978-1-5090-0232-0
DOI :
10.1109/RADECS.2015.7365673
