Title :
Total Dose and SEE Testing of the Intersil ISL75052SEH Low Dropout Regulator
Author :
N. W. van Vonno;J. S. Gill;L. G. Pearce;C. Boucheron;E. J. Thomson
Author_Institution :
Intersil Corp., Palm Bay, FL, USA
Abstract :
We report the results of SEE and low and high dose rate total dose testing of the Intersil ISL75052SEH low dropout regulator (LDO) together with a discussion of electrical specifications and fabrication process.
Keywords :
"Testing","Transient analysis","Regulators","Annealing","Radiation effects","Temperature sensors","Voltage control"
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN :
978-1-5090-0232-0
DOI :
10.1109/RADECS.2015.7365687
