• DocumentCode
    3718614
  • Title

    Total Ionizing Dose Effects in Phase-Locked Loop ICs and Frequency Synthesizers

  • Author

    Denis I. Sotskov;Vadim V. Elesin;Aleksander G. Kuznetsov;Galina N. Nazarova;George V. Chukov;Dmitry V. Boychenko;Vitally A. Telets;Nikolay A. Usachev

  • Author_Institution
    Moscow Eng. Phys. Inst., Nat. Res. Nucl. Univ. MEPhI, Moscow, Russia
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    This paper presents a brief overview of total ionizing dose effects for a variety of PLL ICs and PLL-based frequency synthesizer implemented in commercial bulk CMOS, silicon-on-insulator CMOS, BiCMOS and SiGe BiCMOS technology processes with frequency range up to 8 GHz. Total dose sensitivity data of PLL ICs have been obtained at the SPELS test center, based on comprehensive parametric and functional control.
  • Keywords
    "Phase locked loops","CMOS integrated circuits","BiCMOS integrated circuits","CMOS technology","Frequency synthesizers","Radiation effects"
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
  • Print_ISBN
    978-1-5090-0232-0
  • Type

    conf

  • DOI
    10.1109/RADECS.2015.7365690
  • Filename
    7365690
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3718614