• DocumentCode
    3718892
  • Title

    A study on the properties of complementary frequency selective surfaces for permittivity measurements

  • Author

    Chinwe C. Njoku

  • Author_Institution
    School of Electronic, Electrical & Systems Engineering, Loughborough University, Loughborough, LE11 3TU, UK
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents parametric studies on the geometric and electromagnetic (EM) properties of complementary frequency selective surfaces (CFSS), used in an X-band waveguide for measuring the permittivities of dielectric substrates. This gives understanding of the optimum configuration to be used for the dielectric measurements. The studies were done via simulations using 3D finite-difference timedomain (FDTD) EM software, Empire XPU™ and the results are summarized in this paper.
  • Keywords
    "Resonant frequency","Dielectrics","Permittivity measurement","Frequency selective surfaces","Q-factor","Electromagnetic waveguides"
  • Publisher
    ieee
  • Conference_Titel
    Antennas & Propagation Conference (LAPC), 2015 Loughborough
  • Type

    conf

  • DOI
    10.1109/LAPC.2015.7365990
  • Filename
    7365990
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3718892