• DocumentCode
    3720336
  • Title

    A study on electrical lifespan of VI by means of calculation of arc energy during arcing time in synthetic tests

  • Author

    Byoung-Chul Kim;Sung-Tae Kim;Kil-Young Ahn;Young-Geun Kim

  • Author_Institution
    Electrotechnology R&D Center, LSIS Co., Ltd, Cheongju, Korea
  • fYear
    2015
  • Firstpage
    81
  • Lastpage
    84
  • Abstract
    This study focused on the evaluation of electrical lifespan of vacuum interrupter by means of calculation of arc energy during arcing time. The repetitive short circuit current breaking tests with synthetic test devices were conducted until the contact could not break the short circuit current in order to identify the limit of electrical life. As a result, the accumulative arc energy was calculated after tests. Moreover, arc energy in short circuit current breaking tests were calculated and compared with the results of synthetic tests.
  • Keywords
    "Contacts","Interrupters","Short-circuit currents","Vacuum arcs","Voltage measurement","Spirals","IEC Standards"
  • Publisher
    ieee
  • Conference_Titel
    Electric Power Equipment ? Switching Technology (ICEPE-ST), 2015 3rd International Conference on
  • Type

    conf

  • DOI
    10.1109/ICEPE-ST.2015.7368350
  • Filename
    7368350