Title :
A study on electrical lifespan of VI by means of calculation of arc energy during arcing time in synthetic tests
Author :
Byoung-Chul Kim;Sung-Tae Kim;Kil-Young Ahn;Young-Geun Kim
Author_Institution :
Electrotechnology R&D Center, LSIS Co., Ltd, Cheongju, Korea
Abstract :
This study focused on the evaluation of electrical lifespan of vacuum interrupter by means of calculation of arc energy during arcing time. The repetitive short circuit current breaking tests with synthetic test devices were conducted until the contact could not break the short circuit current in order to identify the limit of electrical life. As a result, the accumulative arc energy was calculated after tests. Moreover, arc energy in short circuit current breaking tests were calculated and compared with the results of synthetic tests.
Keywords :
"Contacts","Interrupters","Short-circuit currents","Vacuum arcs","Voltage measurement","Spirals","IEC Standards"
Conference_Titel :
Electric Power Equipment ? Switching Technology (ICEPE-ST), 2015 3rd International Conference on
DOI :
10.1109/ICEPE-ST.2015.7368350