Title :
Analysis of temperature effect on electromagnetic susceptibility of microcontroller
Author :
Zhenhe Liang;Changlin Zhou;Shouguo Zhao;Tong Liu;Zhenyi Wang
Author_Institution :
School of information system engineering, Zhengzhou Institute of Information Science and Technology, Henan, China
Abstract :
This paper presents a study about temperature effect on the conducted susceptibility level of a microcontroller. Based on direct power injection, the electromagnetic susceptibility of microcontroller is measured under different temperatures. Measurement results show that different temperature conditions could result in fluctuations of conducted susceptibility level. To analyze the temperature effect on susceptibility level, several potential threats in passive part, microcontroller input/output buffer and clock signal are presented in this paper.
Keywords :
"Temperature measurement","Frequency measurement","Radio frequency","Semiconductor device measurement","Electric potential","Electromagnetics","Temperature distribution"
Conference_Titel :
Environmental Electromagnetics (CEEM), 2015 7th Asia-Pacific Conference on
Print_ISBN :
978-1-4673-9444-4
DOI :
10.1109/CEEM.2015.7368678
