DocumentCode :
3720662
Title :
Study on the CSE problem induced by shielding can during smart mobile phone design
Author :
Jiang Haiying; Gao Yougang; Zhang Dan; Wang Chen
Author_Institution :
Electron. Eng. Coll., Beijing Univ. of Posts &
fYear :
2015
Firstpage :
282
Lastpage :
286
Abstract :
In this Paper firstly, the CSE (Conducted Spurious Emission) problem induced by shielding can in smart mobile phone design is experimentally analyzed, and the feasible solution is found. Then, the elements of circuits, which can be influenced by shielding can in smart mobile phone are classified into two categories, and they are the components and the micro-strip line. At last, by method of CST simulation the influence from shielding can´s top face and wall to impedance of micro-strip line is further studied, and the guidelines for micro-strip line design to avoid shielding can´s influence are also given.
Keywords :
"Simulation","Electromagnetic compatibility","Electromagnetic interference","Radio frequency","Face"
Publisher :
ieee
Conference_Titel :
Environmental Electromagnetics (CEEM), 2015 7th Asia-Pacific Conference on
Print_ISBN :
978-1-4673-9444-4
Type :
conf
DOI :
10.1109/CEEM.2015.7368686
Filename :
7368686
Link To Document :
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