DocumentCode :
3721053
Title :
Using SiC MOSFETs to improve reliability of EV inverters
Author :
Hao Zheng;Xubin Wang;Xuemei Wang;Li Ran;Bo Zhang
Author_Institution :
School of Electric Power, South China University of Technology, Guangzhou, 510640, P.R China
fYear :
2015
Firstpage :
359
Lastpage :
364
Abstract :
Wide bandgap semiconductor devices like SiC have achieved more and more attentions in electric vehicles-(EVs) because of their high-temperature capability, high-power density, and high efficiency. As all known, EVs frequently operate in acceleration, deceleration and low speed driving in urban traffic. Thus, not only the rated operation condition should be considered, but also some extreme operation conditions. In order to study the variations of junction temperature of SiC-based MOSFETs comparing with Si-based IGBT of EVs inverter at different operation condition, an electro-thermal coupling model for 3-phase inverter of permanent magnet synchronous motor (PMSM) is used in this paper. Simulation results show that the maximum junction temperatures and junction temperature fluctuations of SiC MOSFETs are quite lower than that of Si IGBTs in all test conditions.
Keywords :
"Junctions","Insulated gate bipolar transistors","Silicon carbide","MOSFET","Inverters","Silicon","Temperature"
Publisher :
ieee
Conference_Titel :
Wide Bandgap Power Devices and Applications (WiPDA), 2015 IEEE 3rd Workshop on
Type :
conf
DOI :
10.1109/WiPDA.2015.7369267
Filename :
7369267
Link To Document :
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