DocumentCode :
3721068
Title :
Study of the turn-on of various high-voltage SiC thyristors
Author :
Heather O´Brien;Aderinto Ogunniyi;William Shaheen;Sei-Hyung Ryu
Author_Institution :
U.S. Army Research Laboratory, RDRL-SED-P Adelphi, MD USA
fYear :
2015
Firstpage :
5
Lastpage :
9
Abstract :
This research is focused on characterization of the turn-on transition of high voltage SiC thyristors of different epilayer thicknesses and active area sizes to determine their suitability and limitations in high-dI/dt, fast-switching applications. The unique aspects of this study include the very high current density being switched through the thyristors over a short period of time at initial turn-on, resulting in very high instantaneous dissipated power over the small device volume. The devices that were characterized were 6 kV, 0.5 cm2 super gate turn-off thyristors (SGTOs), 10 kV, 1.05 cm2 SGTOs, and 15 kV, 1.05 cm2 SGTOs, all fabricated by Cree, Inc. for the Army Research Laboratory. The highest dI/dt and current density were 13 kA/microsecond and 3.2 kA/cm2 for a parallel pair of 0.5 cm2 thyristors, with pulse current peaking 250 ns from initial gate trigger. These evaluations help determine tradeoffs between series-stacking two lower-voltage thyristors versus using a single thicker-epi device, or paralleling two small-area devices versus switching one larger device, for fast-switching applications.
Keywords :
"Logic gates","Thyristors","Silicon carbide","Switches","Current density","Delays","Capacitors"
Publisher :
ieee
Conference_Titel :
Wide Bandgap Power Devices and Applications (WiPDA), 2015 IEEE 3rd Workshop on
Type :
conf
DOI :
10.1109/WiPDA.2015.7369283
Filename :
7369283
Link To Document :
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