Title : 
Evaluation and applications of 600V/650V enhancement-mode GaN devices
         
        
            Author : 
Xiucheng Huang;Tao Liu;Bin Li;Fred C. Lee;Qiang Li
         
        
            Author_Institution : 
Center for Power Electronics Systems, Virginia Tech Blacksburg, VA, USA
         
        
        
        
        
            Abstract : 
This paper presents elaborate evaluation of 600V/650V enhancement mode gallium nitride (GaN) devices. The switching loss mechanism and the impact of package and driving circuit parameters are illustrated in detail. The hard-switching turn-on loss is dominant due to junction capacitor charge of the freewheeling switch. The turn-off loss is much smaller and it can be further improved by driving circuit parameters and packaging. The driving circuit taking consider of high dv/dt and di/dt immunity is discussed. A few design examples are shown to demonstrate the advantage of GaN and the impact of GaN on system design.
         
        
            Keywords : 
"Gallium nitride","Logic gates","Inductance","Switching loss","Switches","Silicon","MOSFET"
         
        
        
            Conference_Titel : 
Wide Bandgap Power Devices and Applications (WiPDA), 2015 IEEE 3rd Workshop on
         
        
        
            DOI : 
10.1109/WiPDA.2015.7369318