Title :
Application and reliability analysis of sintered silver preforms for die attachment of wide bandgap devices
Author :
Sayan Seal;Michael D. Glover;H. Alan Mantooth
Author_Institution :
Department of Electrical Engineering, University of Arkansas, Fayetteville, AR, USA
Abstract :
Sintered nanosilver paste has been demonstrated to have superior electrical, mechanical, and thermal properties as compared to other state-of-the-art die attach materials available today. However, prior to sintering, the material has to be applied on the substrate surface in the form of a wet paste. In order to ensure adequate wetting of the die bonding surface, a manual "scrub-in" step is typically performed using mild pressure. The consistency of the paste and the scrub-in procedure poses a challenge in obtaining a bond line with uniform thickness. A sloping bond line makes it susceptible to fracture at the narrow end as a result of temperature cycling. Moreover, for any applications involving a stacked or 3D architecture, near flat die surfaces are a necessary requirement. Nanosilver preforms are proposed as a solution to address this issue. Die shear test results and cross section observations collected before and after thermal shock testing of die attached using nanosilver preforms is presented.
Keywords :
"Preforms","Substrates","Silver","Bonding","Electric shock","Testing","Microassembly"
Conference_Titel :
Wide Bandgap Power Devices and Applications (WiPDA), 2015 IEEE 3rd Workshop on
DOI :
10.1109/WiPDA.2015.7369326