DocumentCode
3722120
Title
Latest results on the HV-CMOS pixel sensor in the ams H18 process
Author
Simon Feigl
Author_Institution
CERN, Geneva, Switzerland
fYear
2015
Firstpage
1
Lastpage
4
Abstract
High voltage CMOS (HV-CMOS) pixel sensors are active pixel sensors which have been developed for charged particle detection in high-energy physics experiments. The relatively new HV-CMOS processes on the market enable the implementation of in-pixel logic on the sensor, allowing for semihybrid detector concepts with novel read-out techniques. Early prototype sensors have shown very high radiation hardness, a key property for high-energy physics use. The latest prototype fabricated in the ams H18 process has been measured in a particle test beam for efficiency. Results are presented for a non-irradiated and a neutron-irradiated sensor up to 1 × 1015 (1 MeV neq/cm2). Outlook is given on how to improve the already promising results as well as on further measurements and future development.
Keywords
"Detectors","Semiconductor device measurement","Charge carriers","Atmospheric measurements","Particle measurements","Voltage measurement","Prototypes"
Publisher
ieee
Conference_Titel
SENSORS, 2015 IEEE
Type
conf
DOI
10.1109/ICSENS.2015.7370670
Filename
7370670
Link To Document