DocumentCode
3722177
Title
Combining MDL and BIC to Build BNs for System Reliability Modeling
Author
Xiaopin Zhong;Weizhen You
Author_Institution
Shenzhen Key Lab. of Electromagn. Control, Shenzhen Univ., Shenzhen, China
fYear
2015
Firstpage
1
Lastpage
4
Abstract
Bayesian networks (BNs) is widely used for system reliability modeling because of its versatility. It is crucial to build BNs from reliability data without experts´ intervene. However, the BNs structure learning is still an open problem. Traditional approaches always integrate a structure scoring metric with a particular heuristically searching method. This usually overfits or underfits the data. In this paper, we propose a new method that combines the Minimal Description Length principle (MDL) and Bayesian Information Criterion (BIC) to partially overcome the weakness of traditional mothods. Simula-tions show that the proposed method can effectively reduce the overfitting and underfitting of the BN model, thus improving the accuracy of the reliability estimation results.
Keywords
"Reliability","Bayes methods","Measurement","Estimation","Probabilistic logic","Simulation","Complexity theory"
Publisher
ieee
Conference_Titel
Information Science and Security (ICISS), 2015 2nd International Conference on
Type
conf
DOI
10.1109/ICISSEC.2015.7370987
Filename
7370987
Link To Document