DocumentCode :
3723414
Title :
Redundancy based interconnect duplication to mitigate soft errors in SRAM-based FPGAs
Author :
Naifeng Jing;Jiacheng Zhou;Jianfei Jiang;Xin Chen;Weifeng He;Zhigang Mao
Author_Institution :
Department of Micro-Nano Electronics, Shanghai Jiao Tong University, China
fYear :
2015
Firstpage :
764
Lastpage :
769
Abstract :
Soft error induced reliability problem has already become a major concern for modern SRAM-based FPGAs (Field Programmable Gate Arrays) even at the ground level. In this paper, we propose a duplication-with-recovery (DWR) technique to recover the configuration bit faults on interconnects, which contribute to the majority of soft errors in FPGAs. Based on a study on the detailed routing structure in real FPGAs, DWR leverages redundant resources for interconnect duplication and enables fault recovery with lightweight circuit-level support. Compared with traditional fault tolerant techniques, DWR retains the fault recovering capability but eliminates expensive copies. The experimental results show that a large portion of the interconnects can be protected, which in consequence significantly reduces the vulnerable configuration bits. In addition, DWR does not alter the placement and routing from standard design flow, and therefore does not affect the design closure but greatly improves the design reliability in a cost-effective way.
Keywords :
"Circuit faults","Field programmable gate arrays","Routing","Integrated circuit interconnections","Switches","Wires","Table lookup"
Publisher :
ieee
Conference_Titel :
Computer-Aided Design (ICCAD), 2015 IEEE/ACM International Conference on
Type :
conf
DOI :
10.1109/ICCAD.2015.7372647
Filename :
7372647
Link To Document :
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