DocumentCode
3723414
Title
Redundancy based interconnect duplication to mitigate soft errors in SRAM-based FPGAs
Author
Naifeng Jing;Jiacheng Zhou;Jianfei Jiang;Xin Chen;Weifeng He;Zhigang Mao
Author_Institution
Department of Micro-Nano Electronics, Shanghai Jiao Tong University, China
fYear
2015
Firstpage
764
Lastpage
769
Abstract
Soft error induced reliability problem has already become a major concern for modern SRAM-based FPGAs (Field Programmable Gate Arrays) even at the ground level. In this paper, we propose a duplication-with-recovery (DWR) technique to recover the configuration bit faults on interconnects, which contribute to the majority of soft errors in FPGAs. Based on a study on the detailed routing structure in real FPGAs, DWR leverages redundant resources for interconnect duplication and enables fault recovery with lightweight circuit-level support. Compared with traditional fault tolerant techniques, DWR retains the fault recovering capability but eliminates expensive copies. The experimental results show that a large portion of the interconnects can be protected, which in consequence significantly reduces the vulnerable configuration bits. In addition, DWR does not alter the placement and routing from standard design flow, and therefore does not affect the design closure but greatly improves the design reliability in a cost-effective way.
Keywords
"Circuit faults","Field programmable gate arrays","Routing","Integrated circuit interconnections","Switches","Wires","Table lookup"
Publisher
ieee
Conference_Titel
Computer-Aided Design (ICCAD), 2015 IEEE/ACM International Conference on
Type
conf
DOI
10.1109/ICCAD.2015.7372647
Filename
7372647
Link To Document