DocumentCode :
3723435
Title :
Overview of the 2015 CAD contest at ICCAD
Author :
Natarajan Viswanathan;Shih-Hsu Huang;Rung-Bin Lin;Myung-Chul Kim
Author_Institution :
IBM Corporation, Austin, TX 78758, USA
fYear :
2015
Firstpage :
910
Lastpage :
911
Abstract :
The 2015 CAD Contest at ICCAD presents cutting-edge, real-world EDA problems and challenging benchmarks derived from modern industrial designs. It also provides a standard, publicly available evaluation framework for each of the problems. The ever-increasing complexity of integrated circuit design has brought forth new and challenging problems for the EDA community. These require novel, efficient, and high-quality algorithms and methodologies. It is our hope that the CAD Contest at ICCAD would encourage timely and much-needed research on these critical problems in the field of EDA.
Keywords :
"Design automation","Benchmark testing","Three-dimensional displays","Cooling","Cities and towns","Physical design","Computer science"
Publisher :
ieee
Conference_Titel :
Computer-Aided Design (ICCAD), 2015 IEEE/ACM International Conference on
Type :
conf
DOI :
10.1109/ICCAD.2015.7372668
Filename :
7372668
Link To Document :
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