DocumentCode :
3723796
Title :
Performance analysis and improvement of nanoscale double gate Junctionless transistor based inverter using high-K gate dielectrics
Author :
Achinta Baidya;T. R. Lenka;S. Baishya
Author_Institution :
Electronics and Communication Engineering Department, Mizoram University, Aizawl 796004, India
fYear :
2015
Firstpage :
1
Lastpage :
4
Abstract :
In this paper an inverter based on three dimensional (3D) double-gate Junctionless Nanowire Transistor (JNT) of 20nm gate length is proposed. Extensive mixed mode simulation is performed for the inverter circuit to investigate several inverter characteristics such as voltage transfer characteristics, switching characteristics, inverter gain, Noise Margin. For the betterment of these features, inverter circuits of junctionless transistors with higher gate oxide are investigated. It is observed that inverter with the high-K material (HfO2) as gate dielectric shows improvement in inverter characteristics with respect to SiO2 and Si3N4. Thus by choosing the proper gate material performance improvement of a junctionless inverter can be achieved in order to make it a promising candidate for future CMOS Technology.
Keywords :
"Inverters","Logic gates","Transistors","Dielectrics","Hafnium compounds","Integrated circuit modeling","Semiconductor process modeling"
Publisher :
ieee
Conference_Titel :
TENCON 2015 - 2015 IEEE Region 10 Conference
ISSN :
2159-3442
Print_ISBN :
978-1-4799-8639-2
Electronic_ISBN :
2159-3450
Type :
conf
DOI :
10.1109/TENCON.2015.7373040
Filename :
7373040
Link To Document :
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