• DocumentCode
    3723800
  • Title

    Study on aging of material for GIS sealing ring

  • Author

    Ronghui Huang; Xin Zhang; Qiaodi Zeng; Wei Tao; Zhaofang Zhu; Yongpeng Meng; Xiaohua Wang; Shengjun Lin

  • Author_Institution
    Shenzhen Power Supply Bureau, 518001, China
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Gas insulated metal-enclosed switchgear (GIS) is widely used in recent years for its high reliability, less maintenance and excellent insulation properties. But with the increasing use of GIS, the defects and failures also appear. According to the statistics, 30%~40% of the GIS defects are caused by SF6 leakage. And the main reason of SF6 leakage is the defect of the sealing ring. This paper selects two common materials for GIS sealing ring: NBR and EPDM, and puts them in the environment with high temperature and humidity at the same time for aging. After a certain period of time, they are taken out and put to some experiments to test their properties. We can also analyze how the properties change with the aging time by adjusting the experiment period. And it can also be found which material is better as the sealing ring by comparing the properties of NBR and EPDM.
  • Keywords
    "Gas insulation","Rubber","Temperature","Accelerated aging","Reliability"
  • Publisher
    ieee
  • Conference_Titel
    TENCON 2015 - 2015 IEEE Region 10 Conference
  • ISSN
    2159-3442
  • Print_ISBN
    978-1-4799-8639-2
  • Electronic_ISBN
    2159-3450
  • Type

    conf

  • DOI
    10.1109/TENCON.2015.7373044
  • Filename
    7373044