• DocumentCode
    3724808
  • Title

    Chip-package-PCB co-simulation for power integrity design at the early design stage

  • Author

    Yutaka Uematsu;Hitoshi Taniguchi;Masahiro Toyama;Masayoshi Yagyu;Hideki Osaka

  • Author_Institution
    Hitachi, Ltd., Research & Development Group, Yokohama-shi, Kanagawa, 244-0817, Japan
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    451
  • Lastpage
    452
  • Abstract
    We investigated a chip-package-PCB co-simulation method for power integrity design at the early design stage. Due to the number of design parameters that need to be surveyed to optimize power integrity at this stage, the method requires fast power integrity analysis and a convenient way to revise design parameters. By applying a PEEC method with different mesh sizes for each component and reducing the input cost for the power and ground plane layout, we can reduce simulation costs with permissible levels of simulation error.
  • Keywords
    "Large scale integration","Integrated circuit modeling","Capacitors","Layout","Impedance","Simulation","Power supplies"
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation (APCAP), 2015 IEEE 4th Asia-Pacific Conference on
  • Type

    conf

  • DOI
    10.1109/APCAP.2015.7374446
  • Filename
    7374446