DocumentCode :
3724808
Title :
Chip-package-PCB co-simulation for power integrity design at the early design stage
Author :
Yutaka Uematsu;Hitoshi Taniguchi;Masahiro Toyama;Masayoshi Yagyu;Hideki Osaka
Author_Institution :
Hitachi, Ltd., Research & Development Group, Yokohama-shi, Kanagawa, 244-0817, Japan
fYear :
2015
fDate :
6/1/2015 12:00:00 AM
Firstpage :
451
Lastpage :
452
Abstract :
We investigated a chip-package-PCB co-simulation method for power integrity design at the early design stage. Due to the number of design parameters that need to be surveyed to optimize power integrity at this stage, the method requires fast power integrity analysis and a convenient way to revise design parameters. By applying a PEEC method with different mesh sizes for each component and reducing the input cost for the power and ground plane layout, we can reduce simulation costs with permissible levels of simulation error.
Keywords :
"Large scale integration","Integrated circuit modeling","Capacitors","Layout","Impedance","Simulation","Power supplies"
Publisher :
ieee
Conference_Titel :
Antennas and Propagation (APCAP), 2015 IEEE 4th Asia-Pacific Conference on
Type :
conf
DOI :
10.1109/APCAP.2015.7374446
Filename :
7374446
Link To Document :
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