Title :
Layered semiconductor GeS: A metamaterial with extremely low refractive index
Author :
A. Ozturk;R. Suleymanli
Author_Institution :
Department of Mechatronics Engineering, Marmara University, 34722, Kadikoy, Istanbul, Turkey
Abstract :
Reflection and transmission optical spectra of layered semiconductor GeS are investigated. It is shown, that this semiconductor can be considered as natural metamaterial with extremely low, n=0.14, refractive index in wide spectral region, λ=0.8-1.0 μm.
Keywords :
"Refractive index","Crystals","Metamaterials","Dielectrics","Reflection","Interference","Periodic structures"
Conference_Titel :
Lasers and Electro-Optics Pacific Rim (CLEO-PR), 2015 11th Conference on
DOI :
10.1109/CLEOPR.2015.7376330
