DocumentCode :
3726299
Title :
High precision prediction of thin film composition by LIBS
Author :
Jung Hwan In;Chan Kyu Kim Seok Hee Lee;Sungho Jeong
Author_Institution :
School of Mechatronics, Gwangju Institute of Science and Technology 1 Oryong-dong Buk-gu, Gwangju 500-712, Republic of Korea
Volume :
3
fYear :
2015
Firstpage :
1
Lastpage :
2
Abstract :
The measurement of average composition or spatial elemental distribution in thin films of a few micrometer thickness is important for product evaluation or process monitoring in thin film product industry. This work reports that the average composition of thin solar cell films (~ 2 mm) could be predicted with high precision (<; 1% relative standard deviation) by laser induced breakdown spectroscopy (LIBS). The depthwise distribution of constituent elements could also be measured with a spatial resolution below 100 nm as was confirmed with secondary ion mass spectrometry. It is discussed that the high precision of LIBS with its intrinsic rapid, no sample preparation, in-air measurement capability provides a powerful technique for composition monitoring at manufacturing sites.
Keywords :
"Films","Photovoltaic cells","Spectroscopy","Monitoring","Electric breakdown","Plasmas","Logic gates"
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Pacific Rim (CLEO-PR), 2015 11th Conference on
Type :
conf
DOI :
10.1109/CLEOPR.2015.7376416
Filename :
7376416
Link To Document :
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