Title :
Compact device for detecting single event effects in semiconductor components
Author :
Pavel Broul?m;Jan Bartovsk?;Jan Broul?m;Petr Burian;Vja?eslav Georgiev;Michael Hol?k;V?clav Kraus;Ale? Krutina;Jan Moldaschl;Vladim?r Pavl??ek;Stanislav Posp??il;Jakub Vl??ek
Author_Institution :
Faculty of Electrical Engineering, University of West Bohemia, Univerzitn? 22, 306 14, Pilsen, Czech Republic
Abstract :
The paper describes a compact system for detecting Single Event Effects (SEE) in semiconductor components. The SEE is caused by a hit into a electronic chip with an energetic particle. The hit can cause unexpected behaviour of the system. The tested component is called Device Under Test (DUT). The structure of the system is shown and used components are described with their main tasks. Some of results of the running system are shown.
Keywords :
"Detectors","Probes","Radiation detectors","Microprogramming","Semiconductor device measurement","MOSFET","Power supplies"
Conference_Titel :
Telecommunications Forum Telfor (TELFOR), 2015 23rd
DOI :
10.1109/TELFOR.2015.7377548
