Title :
Evaluation of gamma ray durability of RF tag and application to the radiation environment
Author :
Nobuyuki Teraura;Kunio Ito;Daisuke Kobayashi;Kouichi Sakurai
Author_Institution :
Terrara Code Research Institute, Tokai, Japan
Abstract :
As for common RF tag, the circuitry operator part is formed with the semiconductor. Then, when radiation, such as a gamma ray, is irradiated, a recoverable soft error and unrecoverable hard error will occur. Therefore, it cannot be used depending on the exposure dose of radiation. However, a radiation-proof ability can be raised by incorporating a shielding and an error correction. Then, RF tag which covered was irradiated with the gamma ray originating in Cesium 137 or Cobalt 60 grade, and the durability was evaluated. The application which uses this radiation-proof RF tag under radiation environment is proposed. They are management of the radioactive component generated from radioactive waste or a decommissioning process to improve the traceability, etc. Moreover, the evaluation result of RF tag used for management of the medical relationship instrument which performs gamma sterilization is described.
Keywords :
"Radio frequency","Radiation effects","Random access memory","Nonvolatile memory","Ferroelectric films","Radiofrequency identification","Semiconductor device measurement"
Conference_Titel :
RFID Technology and Applications (RFID-TA), 2015 IEEE International Conference on
DOI :
10.1109/RFID-TA.2015.7379809