DocumentCode
3728760
Title
An extended testability modeling method based on the enable relationship between faults and tests
Author
Yi Deng; Junyou Shi; Kan Liu
Author_Institution
School of Reliability and Systems Engineering, Beihang University, Beijing, China
fYear
2015
Firstpage
1
Lastpage
6
Abstract
To improve the accuracy of testability modeling, the paper proposes an extended testability modeling method based on FTE (the enable relationship between faults and tests). The characteristics of FTE are analyzed, and corresponding mathematical definition is given. Besides, the graphic modeling method of the extended model of testability considering FTE is designed, and the acquisition method of the diagnosis matrixes considering FTE is also proposed. At last, using the traditional modeling method and an extended testability modeling method based on the enable relationship between faults and tests to model of the laser inertial navigation system.
Keywords
"Mathematical model","Analytical models","Field programmable gate arrays","Frequency modulation","Navigation","Yttrium"
Publisher
ieee
Conference_Titel
Prognostics and System Health Management Conference (PHM), 2015
Type
conf
DOI
10.1109/PHM.2015.7380032
Filename
7380032
Link To Document