• DocumentCode
    3728760
  • Title

    An extended testability modeling method based on the enable relationship between faults and tests

  • Author

    Yi Deng; Junyou Shi; Kan Liu

  • Author_Institution
    School of Reliability and Systems Engineering, Beihang University, Beijing, China
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    To improve the accuracy of testability modeling, the paper proposes an extended testability modeling method based on FTE (the enable relationship between faults and tests). The characteristics of FTE are analyzed, and corresponding mathematical definition is given. Besides, the graphic modeling method of the extended model of testability considering FTE is designed, and the acquisition method of the diagnosis matrixes considering FTE is also proposed. At last, using the traditional modeling method and an extended testability modeling method based on the enable relationship between faults and tests to model of the laser inertial navigation system.
  • Keywords
    "Mathematical model","Analytical models","Field programmable gate arrays","Frequency modulation","Navigation","Yttrium"
  • Publisher
    ieee
  • Conference_Titel
    Prognostics and System Health Management Conference (PHM), 2015
  • Type

    conf

  • DOI
    10.1109/PHM.2015.7380032
  • Filename
    7380032