DocumentCode :
3728814
Title :
Product performance states change based failure prognostic analysis method
Author :
Yonghong Li; Yun Wang; Wenli Ouyang
Author_Institution :
Quality Engineering Center, China Aero Polytechnology Establishment, Beijing, 100028, China
fYear :
2015
Firstpage :
1
Lastpage :
6
Abstract :
Prognostic and Health Management (PHM) provides a decision-making basis for task resuming and state-based maintenance through assessment of product residual life or residual function holding time, which is obtained by comparing the results using different parameters of the failure symptom under the same Prognostic prediction model. The key of a failure prediction is selection of applicable failure symptom characteristic parameter as well as the prediction model. In this paper, failure features of electronic product have been analyzed and three basic performance state change behaviors have been discussed. Furthermore, the method for product states changing behaviors analysis has been suggested. With input data gathered from product constituents (e.g. electronic devices)´ faults mode, performance degradation, parameter drift, and so forth, fault injection to product´s EDA model to get state change track were conducted. These state changing processes,combining with the failure causes or failure mechanisms, can be classified and used as a guidance to assist in making up failure prediction or failure detection policy.
Keywords :
Circuit faults
Publisher :
ieee
Conference_Titel :
Prognostics and System Health Management Conference (PHM), 2015
Type :
conf
DOI :
10.1109/PHM.2015.7380086
Filename :
7380086
Link To Document :
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