Research of fault prognostic based on LSSVM for electronic equipment

This paper puts forward a method of fault prognostic based on least squares support vector machine for electronic equipment, because fault information of the electronic equipment is insufficient, high incidence of failure. Firstly it introduces the basic principle and the fault prognostic algorithm of the LSSVM process to fault prognostic. Then, fault prognostic research for the electronic equipment can be from a similar analog band-pass filter circuit. Compared to the least square method and support vector machine method, LSSVM method may apply to the different fault condition of the circuit, which obtained the different results. It shows that the proposed method can achieve graded fault prognostic for the analog circuit, and has the better prediction effect.