• DocumentCode
    3731007
  • Title

    Improved Projection to Latent Structures for quality-relevant process monitoring

  • Author

    Ziwei Liu; Ying Zheng

  • Author_Institution
    School of Automation, Huazhong University of Science and Technology, Wuhan, Hubei, 430074, China
  • fYear
    2015
  • Firstpage
    875
  • Lastpage
    879
  • Abstract
    A process monitoring method called Improved Projection to Latent Structures (IPLS) is proposed in this paper. It aims at changing the oblique projection to orthogonal projection on the input space in basic PLS, thus a decomposition on input space to two orthogonal subspaces is achieved. Moreover, the output space is divided into three parts-a predictable subspace, an unpredictable principal subspace and the unpredictable residual space. The detailed decomposition on both the inputs and outputs enables producers to tell whether an output-relevant fault can be predicted by X. The simulated numerical examples and Tennessee Eastman Process Cases are used to confirm effectiveness of IPLS.
  • Keywords
    "Yttrium","Monitoring","Matrix decomposition","Principal component analysis","Aerospace electronics","Correlation","Fault detection"
  • Publisher
    ieee
  • Conference_Titel
    Chinese Automation Congress (CAC), 2015
  • Type

    conf

  • DOI
    10.1109/CAC.2015.7382621
  • Filename
    7382621