DocumentCode
3731007
Title
Improved Projection to Latent Structures for quality-relevant process monitoring
Author
Ziwei Liu; Ying Zheng
Author_Institution
School of Automation, Huazhong University of Science and Technology, Wuhan, Hubei, 430074, China
fYear
2015
Firstpage
875
Lastpage
879
Abstract
A process monitoring method called Improved Projection to Latent Structures (IPLS) is proposed in this paper. It aims at changing the oblique projection to orthogonal projection on the input space in basic PLS, thus a decomposition on input space to two orthogonal subspaces is achieved. Moreover, the output space is divided into three parts-a predictable subspace, an unpredictable principal subspace and the unpredictable residual space. The detailed decomposition on both the inputs and outputs enables producers to tell whether an output-relevant fault can be predicted by X. The simulated numerical examples and Tennessee Eastman Process Cases are used to confirm effectiveness of IPLS.
Keywords
"Yttrium","Monitoring","Matrix decomposition","Principal component analysis","Aerospace electronics","Correlation","Fault detection"
Publisher
ieee
Conference_Titel
Chinese Automation Congress (CAC), 2015
Type
conf
DOI
10.1109/CAC.2015.7382621
Filename
7382621
Link To Document