• DocumentCode
    3731701
  • Title

    Fast calculation of system-level ESD noise coupling to a microstrip line using PEEC method

  • Author

    Junsik Park;Jingook Kim;Jongsung Lee;Seongmoo Kim;Byongsu Seol

  • Author_Institution
    School of ECE, Ulsan National Institute of Science and Technology, Ulsan, South Korea
  • fYear
    2015
  • Firstpage
    132
  • Lastpage
    135
  • Abstract
    The system-level ESD coupling on a microstrip line is calculated using the partial element equivalent circuit (PEEC) method both in frequency and time domains. A simplified MNA matrix for the victim trace is proposed to quickly calculate the charge and current induced due to the ESD event. The calculated coupling transfer impedance and the ESD waveforms coupled on the traces are validated by comparison with measurements both in frequency and time domains.
  • Keywords
    "Electrostatic discharges","Couplings","Microstrip","Time-domain analysis","Frequency measurement","Transmission line matrix methods","Impedance"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Design of Advanced Packaging and Systems Symposium (EDAPS), 2015 IEEE
  • Type

    conf

  • DOI
    10.1109/EDAPS.2015.7383685
  • Filename
    7383685
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3731701