• DocumentCode
    37318
  • Title

    Light-Trapping Properties of a Diffractive Honeycomb Structure in Silicon

  • Author

    Thorstensen, J. ; Gjessing, Jo ; Marstein, E.S. ; Foss, S.E.

  • Author_Institution
    Dept. of Solar Energy, Inst. for Energy Technol., Kjeller, Norway
  • Volume
    3
  • Issue
    2
  • fYear
    2013
  • fDate
    Apr-13
  • Firstpage
    709
  • Lastpage
    715
  • Abstract
    Thinner solar cells will reduce material costs, but require light trapping for efficient optical absorption. We have already reported development of a method for fabrication of diffractive structures on solar cells. In this paper, we create these structures on wafers with a thickness between 21 and 115 μm, and present measurements on the light-trapping properties of these structures. These properties are compared with those of random pyramid textures, isotropic textures, and a polished sample. We divide optical loss contributions into front-surface reflectance, escape light, and parasitic absorption in the rear reflector. We find that the light-trapping performance of our diffractive structure lies between that of the planar and the random pyramid-textured reference samples. Our processing method, however, causes virtually no thinning of the wafer, is independent of crystal orientation, and does not require seeding from, e.g., saw damage, making it well suited for application to thin silicon wafers.
  • Keywords
    absorption coefficients; crystal orientation; elemental semiconductors; honeycomb structures; infrared spectra; optical losses; silicon; visible spectra; Si; crystal orientation; diffractive honeycomb structure; diffractive structure fabrication; front-surface reflectance; light escaping; light-trapping properties; optical absorption; optical loss contributions; parasitic absorption; planar pyramid-textured reference samples; random pyramid-textured reference samples; size 21 mum to 115 mum; solar cells; thin silicon wafers; Absorption; Optical diffraction; Optical losses; Optical surface waves; Silicon; Surface texture; Surface treatment; Laser processing; light trapping; optical characterization; silicon solar cells;
  • fLanguage
    English
  • Journal_Title
    Photovoltaics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    2156-3381
  • Type

    jour

  • DOI
    10.1109/JPHOTOV.2013.2240563
  • Filename
    6425390