DocumentCode :
3733050
Title :
Study on reliability assessment method for Step-down-stress accelerated life test based on Bayesian theory
Author :
Honghua Hu;Jun Yao;Jingyue Yang;Shuizhuang Miao;Shouzhen Wang
Author_Institution :
School of Reliability and Systems Engineering, Beihang University, Beijing, China
fYear :
2015
Firstpage :
1037
Lastpage :
1040
Abstract :
An assessment method for Step-down-stress accelerated life test data based on Bayesian theory is proposed in this paper. For the problem of the limited test information gained in the small sample life test, the assessment result is may not accurate enough. In this paper, we assume a certain prior distribution, according to prior information. Then, establish the posterior distribution combined with the accelerate life test data. Finally calculate the parameters of the accelerated model and life distribution. The simulation case verifies the effectiveness of the proposed approach.
Keywords :
"Life estimation","Stress","Reliability","Silicon","Data models","Maximum likelihood estimation","Bayes methods"
Publisher :
ieee
Conference_Titel :
Industrial Engineering and Engineering Management (IEEM), 2015 IEEE International Conference on
Type :
conf
DOI :
10.1109/IEEM.2015.7385806
Filename :
7385806
Link To Document :
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