DocumentCode :
3734469
Title :
A new metric on parallel coordinates and its application for high-dimensional data visualization
Author :
Tran Van Long
Author_Institution :
Faculty of Basic Sciences, University of Transport and Communications, Hanoi, Vietnam
fYear :
2015
Firstpage :
297
Lastpage :
301
Abstract :
High-dimensional data visualization is a changing task with many applications in a various fields of sciences. Parallel coordinates is one of the most widely used information visualization technique for multivariate data analysis and high-dimensional geometry. The dimension ordering is an original problem for exploring structures in a high-dimensional data space. In this paper, we propose a new metric for measuring distance between two line-segment on the parallel coordinates. The metric is suitable and effective on the parallel coordinates. We use our metric distance for finding an optimal dimension ordering on the parallel coordinates. Finally, we demonstrate our method can be applied to visualize clusters in high-dimensional data on the parallel coordinates.
Keywords :
"Data visualization","Iris","Euclidean distance","Proposals","Correlation","Coordinate measuring machines"
Publisher :
ieee
Conference_Titel :
Advanced Technologies for Communications (ATC), 2015 International Conference on
ISSN :
2162-1020
Print_ISBN :
978-1-4673-8372-1
Type :
conf
DOI :
10.1109/ATC.2015.7388338
Filename :
7388338
Link To Document :
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