DocumentCode :
3734578
Title :
About the functional test of permanent faults in distributed systems
Author :
A. Vaskova;M. Portela-Garc?a;C. L?pez-Ongil;E. S?nchez;M. Sonza Reorda
Author_Institution :
Electronic Technology Department, Carlos III University of Madrid, Legan?s, Spain
fYear :
2015
Firstpage :
1
Lastpage :
6
Abstract :
The effects of permanent faults, arising along working life of digital electronic systems, may impact their reliability and performance. In-field test may help to detect these faults and to prevent serious effects in safety-critical applications. Distributed electronic systems introduce further complexity in this scenario, as the low observability and the lack of maintenance make difficult the detection as well as the identification of failing elements and their repairing. Functional workloads are often used for on-line tests of distributed systems to detect permanent faults. Suitable techniques for test generation and early identification of functionally untestable permanent faults are critical issues that are faced in this work.
Keywords :
"Circuit faults","Fault diagnosis","Solid modeling","Testing","Hardware","Clocks"
Publisher :
ieee
Conference_Titel :
Design of Circuits and Integrated Systems (DCIS), 2015 Conference on
Type :
conf
DOI :
10.1109/DCIS.2015.7388571
Filename :
7388571
Link To Document :
بازگشت