• DocumentCode
    3734638
  • Title

    An analytical model for NDC blocks with single-electron tunneling

  • Author

    Lin Li;Chunhong Chen

  • Author_Institution
    Department of Electrical and Computer Engineering, University of Windsor, Ontario, Canada N9B 3P4
  • fYear
    2015
  • fDate
    7/1/2015 12:00:00 AM
  • Firstpage
    448
  • Lastpage
    451
  • Abstract
    Negative differential conductance (NDC) blocks find many applications in both digital and analog circuits such as memory cells, Schmitt triggers and oscillators. This paper proposes a new single-electron tunneling (SET) based NDC block, and develops an analytical model which can be used for related circuit designs and/or their performance optimization. Simulation results are provided to show the effectiveness of the model with considerations of temperature effects.
  • Keywords
    "Junctions","Integrated circuit modeling","Simulation","Threshold voltage","Tunneling","Temperature","Capacitance"
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO) , 2015 IEEE 15th International Conference on
  • Type

    conf

  • DOI
    10.1109/NANO.2015.7388634
  • Filename
    7388634