DocumentCode
3734638
Title
An analytical model for NDC blocks with single-electron tunneling
Author
Lin Li;Chunhong Chen
Author_Institution
Department of Electrical and Computer Engineering, University of Windsor, Ontario, Canada N9B 3P4
fYear
2015
fDate
7/1/2015 12:00:00 AM
Firstpage
448
Lastpage
451
Abstract
Negative differential conductance (NDC) blocks find many applications in both digital and analog circuits such as memory cells, Schmitt triggers and oscillators. This paper proposes a new single-electron tunneling (SET) based NDC block, and develops an analytical model which can be used for related circuit designs and/or their performance optimization. Simulation results are provided to show the effectiveness of the model with considerations of temperature effects.
Keywords
"Junctions","Integrated circuit modeling","Simulation","Threshold voltage","Tunneling","Temperature","Capacitance"
Publisher
ieee
Conference_Titel
Nanotechnology (IEEE-NANO) , 2015 IEEE 15th International Conference on
Type
conf
DOI
10.1109/NANO.2015.7388634
Filename
7388634
Link To Document