DocumentCode :
3734652
Title :
Modeling and characterization of Cu-graphene heterogeneous interconnects
Author :
Da-Wei Wang;Rui Zhang;Wen-Yan Yin;Wen-Sheng Zhao;Gaofeng Wang
Author_Institution :
Center for Optical and Electromagnetic Research, Zhejiang University, Hangzhou 310058, China
fYear :
2015
fDate :
7/1/2015 12:00:00 AM
Firstpage :
499
Lastpage :
502
Abstract :
In order to exploit graphene materials efficiently, some researcher have proposed Cu-graphene heterogeneous interconnects. In this study, an equivalent circuit model of such novel interconnect is presented, with the interfacial resistance treated appropriately. Then, the electrothermal characterization is carried out based on our self-developed TD-FEM algorithm. It is found that Cu-graphene heterogeneous interconnects could provide superior performance and reliability over the conventional Cu wires.
Keywords :
"Integrated circuit interconnections","Graphene","Wires","Integrated circuit modeling","Conductivity","Electrostatic discharges","Yttrium"
Publisher :
ieee
Conference_Titel :
Nanotechnology (IEEE-NANO) , 2015 IEEE 15th International Conference on
Type :
conf
DOI :
10.1109/NANO.2015.7388648
Filename :
7388648
Link To Document :
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