DocumentCode :
3739941
Title :
A Method to Discover Truth with Two Source Quality Metrics
Author :
Dong Yu;Derong Shen;Mingdong Zhu;Tiezheng Nie;Yue Kou;Ge Yu
Author_Institution :
Coll. of Inf. Sci. &
fYear :
2015
Firstpage :
161
Lastpage :
164
Abstract :
In many web integration applications, there are usually some sources that depict the same entity object with different descriptions, which leads to lots of conflicts. Resolving conflicts and finding the truth can be used to improve the quality of integration or to build a high-quality knowledge base, etc. In the single-truth data conflicting scenario, existing methods have limitations to distinguish false negative, also named as data missing, and false positive. So their source quality measurements are inadequate. Therefore, in this paper, we use recall and false positive rate to measure source quality and present a method to discover truth. The experimental results on three real-word data sets show that the proposed algorithm can effectively distinguish the data missing and false positive and improve the precision of truth discovery.
Keywords :
"Silicon","Measurement","Probability","Computational modeling","Knowledge based systems","Probabilistic logic","Graphical models"
Publisher :
ieee
Conference_Titel :
Web Information System and Application Conference (WISA), 2015 12th
Print_ISBN :
978-1-4673-9371-3
Type :
conf
DOI :
10.1109/WISA.2015.76
Filename :
7396628
Link To Document :
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