• DocumentCode
    3739941
  • Title

    A Method to Discover Truth with Two Source Quality Metrics

  • Author

    Dong Yu;Derong Shen;Mingdong Zhu;Tiezheng Nie;Yue Kou;Ge Yu

  • Author_Institution
    Coll. of Inf. Sci. &
  • fYear
    2015
  • Firstpage
    161
  • Lastpage
    164
  • Abstract
    In many web integration applications, there are usually some sources that depict the same entity object with different descriptions, which leads to lots of conflicts. Resolving conflicts and finding the truth can be used to improve the quality of integration or to build a high-quality knowledge base, etc. In the single-truth data conflicting scenario, existing methods have limitations to distinguish false negative, also named as data missing, and false positive. So their source quality measurements are inadequate. Therefore, in this paper, we use recall and false positive rate to measure source quality and present a method to discover truth. The experimental results on three real-word data sets show that the proposed algorithm can effectively distinguish the data missing and false positive and improve the precision of truth discovery.
  • Keywords
    "Silicon","Measurement","Probability","Computational modeling","Knowledge based systems","Probabilistic logic","Graphical models"
  • Publisher
    ieee
  • Conference_Titel
    Web Information System and Application Conference (WISA), 2015 12th
  • Print_ISBN
    978-1-4673-9371-3
  • Type

    conf

  • DOI
    10.1109/WISA.2015.76
  • Filename
    7396628