• DocumentCode
    3741063
  • Title

    An intense 87Rb cold atomic source for atom interferometry

  • Author

    Li Yingying;Xiong Jijun;Jiang Zhikun

  • Author_Institution
    Key Laboratory of Instrumentation Science and Dynamic Measurement, Ministry of Education, North University of China, Taiyuan, Shanxi 030051, China
  • fYear
    2015
  • fDate
    7/1/2015 12:00:00 AM
  • Firstpage
    30
  • Lastpage
    33
  • Abstract
    We present the implementation and characterization of a slow, intense, and collimated rubidium atomic source for atom interferometry. The continuous 87Rb cold atomic beam is produced by a new compact two-dimensional magneto-optical trap. And it is based on the 2D+MOT design but a much smaller size and a higher flux compared to our original LVIS system. The on-line detecting system developed over a combination of time-of-flight and fluorescence methods is used to optimize the beam parameters. The dependence of the beam flux on detuning and power are investigated in detail respectively, for cooling and pushing laser. The re-pumping laser power influence is also considered. With aError! Reference source not found.10 G/cm magnetic gradient, 3ΓError! Reference source not found. red detuning from resonance for cooling laser and 5ΓError! Reference source not found. red detuning for pushing laser, the obtained cold atomic beam has a high flux of 4.7×109 atoms/s Error! Reference source not found. Error! Reference source not found. It has a narrow longitudinal velocity distribution with mean velocity 10 m/s and full width at half maximum (FWHM)Error! Reference source not found.2 m/sError! Reference source not found. The two-photo stimulated Raman transitions both in Doppler-free and Doppler-sensitive modes are first proceeded, and stable Raman-Ramsey fringes are achieved with twon/2 Error! Reference source not found. Raman pulses.
  • Keywords
    "Atomic beams","Atomic measurements","Laser beams","Cooling","Atom optics","Measurement by laser beam","Interferometry"
  • Publisher
    ieee
  • Conference_Titel
    Optoelectronics and Microelectronics (ICOM), 2015 International Conference on
  • Type

    conf

  • DOI
    10.1109/ICoOM.2015.7398763
  • Filename
    7398763