DocumentCode :
3741168
Title :
Study on modulation transfer characteristic of proximity X-ray imaging system
Author :
Yining Mu;Ping Li
Author_Institution :
School of Science, Changchun University of Science and Technology, Changchun, China
fYear :
2015
fDate :
7/1/2015 12:00:00 AM
Firstpage :
466
Lastpage :
469
Abstract :
This article proposes a system-level optical modulation transfer characteristic detection methodology of proximity focusing X-ray imaging based on principle of contrast fitting to accurate assessment of proximity focusing X-ray imaging system. Firstly, theoretical modulation transfer characteristic of proximity X-ray imaging system is investigated from three aspects: the image-intensifier tubes, the ray source, imaging restriction. Then the generation process of ray source and imaging restriction of its spot size constraints was analyzed from the point of the wave theory. Next, as seen by quantum statistical, imaging noise origin was summarized. Based on the above restriction conditions, finally, system-level optical modulation transfer characteristic can be accurately fitted and being analyzed by different frequency of lead raster imaging was realtime online detected by fluorescence microscopy system. Time domain filtering is not only an effective way to reduce noise constraint but also avoid changing the original imagery information.
Keywords :
"Image resolution","X-ray imaging","Charge coupled devices","Optical imaging","Market research","Image intensifiers"
Publisher :
ieee
Conference_Titel :
Optoelectronics and Microelectronics (ICOM), 2015 International Conference on
Type :
conf
DOI :
10.1109/ICoOM.2015.7398868
Filename :
7398868
Link To Document :
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