Title :
Computer guided product EMC compliance on user´s workshop by means of cloud computing - methodologies and algorithms
Author :
Wei Wu;Yuejia Wu
Author_Institution :
Institute of Innovation, WEIWU INFO, Lisbon, Portugal
Abstract :
All products are obligated to pass Electromagnetic Compatibility (EMC) tests before sale. Due to the uncertainty of Electromagnetic Interference (EMI) location in product, the product EMC compliance is expensive and time consuming. In this paper we present a novel solution to assist industrial users in product EMC compliance, which is a public Computer Aided EMC compliance service platform in Cloud, accessible through Internet by Desktop, Laptop, Pad or Smart Phone. The industrial users may measure voltage signals on EUT with a general-purpose oscilloscope, and upload the data to platform where the data are analyzed and the analysis results indicate the EMI location and EMI level on EUT, to guide users efficiently and effectively modify EUT to approach EMC compliance. It is low cost and easy to use, users only pay the Computing time in Cloud, no software installation, no operation skill and no EMC expertise are required. Methodologies and algorithms of proposed solution are introduced, and illustrated by example.
Keywords :
"Conferences","Computers","Electromagnetic compatibility","Electromagnetic interference","Oscilloscopes","Europe"
Conference_Titel :
Industrial and Information Systems (ICIIS), 2015 IEEE 10th International Conference on
Print_ISBN :
978-1-5090-1741-6
DOI :
10.1109/ICIINFS.2015.7398992