DocumentCode
3741711
Title
A low cost impedance measurement method for integrated circuits
Author
Benoit Couraud;Remy Vauche;Thibaut Deleruyelle;Edith Kussener
Author_Institution
ISEN-Toulon, France
fYear
2015
Firstpage
13
Lastpage
16
Abstract
Impedance matching of a Radio Frequency (RF) device antenna with its integrated circuit chip is necessary to improve efficiency and RF communication quality. This matching can only be done if one knows the chip components impedances. This paper presents a new RFmeasurement method to determine electrical characteristics like s-parameters or impedance of smart cards integrated circuits or antennas, using common measurement devices as a computer, an oscilloscope or any voltage acquisition device, and a directional coupler. Achieved results are compared with vector network analyzer (VNA) measurements and the method is applied to real contactless integrated circuit proximity cards components.
Keywords
"Semiconductor device measurement","Smart cards","Couplers","IP networks"
Publisher
ieee
Conference_Titel
Communication Technology (ICCT), 2015 IEEE 16th International Conference on
Print_ISBN
978-1-4673-7004-2
Type
conf
DOI
10.1109/ICCT.2015.7399784
Filename
7399784
Link To Document