• DocumentCode
    3741711
  • Title

    A low cost impedance measurement method for integrated circuits

  • Author

    Benoit Couraud;Remy Vauche;Thibaut Deleruyelle;Edith Kussener

  • Author_Institution
    ISEN-Toulon, France
  • fYear
    2015
  • Firstpage
    13
  • Lastpage
    16
  • Abstract
    Impedance matching of a Radio Frequency (RF) device antenna with its integrated circuit chip is necessary to improve efficiency and RF communication quality. This matching can only be done if one knows the chip components impedances. This paper presents a new RFmeasurement method to determine electrical characteristics like s-parameters or impedance of smart cards integrated circuits or antennas, using common measurement devices as a computer, an oscilloscope or any voltage acquisition device, and a directional coupler. Achieved results are compared with vector network analyzer (VNA) measurements and the method is applied to real contactless integrated circuit proximity cards components.
  • Keywords
    "Semiconductor device measurement","Smart cards","Couplers","IP networks"
  • Publisher
    ieee
  • Conference_Titel
    Communication Technology (ICCT), 2015 IEEE 16th International Conference on
  • Print_ISBN
    978-1-4673-7004-2
  • Type

    conf

  • DOI
    10.1109/ICCT.2015.7399784
  • Filename
    7399784