Title :
A 2.4-GHz fully integrated ESD-protected low-noise amplifier in SMIC 40 nm CMOS technology
Author :
Dong Ren; Lingling Sun; Mingzhu Zhou; Jun Liu
Author_Institution :
Hangzhou Dianzi University, 310018, China
Abstract :
This paper presents and analyzes a fully integrated electrostatic discharge (ESD)-protected low-noise amplifier (LNA) for low-power consumption and narrow band 2.4GHz application using a cascode inductive source degeneration topology. It can achieve power-constrained simultaneous noise and input matching. The circuit is designed and optimized using SMIC 40nm CMOS technology. The post simulation results show that the LNA achieves 14.45 dB power gain at 2.4GHz with a noise figure of 2.16 dB and input return loss of -18 dB for power consumption of 4.9mW.1.
Keywords :
"Electrostatic discharges","Impedance matching","Impedance","Capacitance","Equivalent circuits","Noise measurement","Layout"
Conference_Titel :
Communication Technology (ICCT), 2015 IEEE 16th International Conference on
Print_ISBN :
978-1-4673-7004-2
DOI :
10.1109/ICCT.2015.7399919