• DocumentCode
    374754
  • Title

    A compact back-end module for high-rate multielement X-ray spectrometers and γ-ray imagers

  • Author

    Pullia, Alberto ; Longoni, Antonio

  • Author_Institution
    Dipartimento di Fisica, Milan Univ., Italy
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Abstract
    A compact single-ADC back-end module for the derandomization, acquisition and memorization of 16 spectra from high-rate multielement radiation detectors has been designed and characterized. The input signals, as provided by external peak stretchers, feed sample and hold circuits operated independently, which makes it possible to capture randomly-occurring events even in the worst case of time coincidences in different detection elements. The stored signals are then passed along synchronously to a common 12-bit 10 MHz flash ADC, by means of a switch array operated as a multiplexer. This provides derandomization of the arrival times of the events. A maximum count rate of about 500 kcounts/s/channel is featured. A homogeneous processing rate among the channels is guaranteed by driving the switches with an “intelligent” digital circuitry implemented in two programmable-logic units. Sliding-scale correction is used to reduce by two order of magnitudes the ADC native differential nonlinearity, and so to meet the requirements of the spectroscopic applications. The measured pulser-peak noise is 1.5 bins r.m.s. over a full scale of ~4000 bins
  • Keywords
    X-ray spectrometers; analogue-digital conversion; gamma-ray apparatus; gamma-ray detection; nuclear electronics; γ-ray imagers; ADC; X-ray spectrometer; back-end module; differential nonlinearity; flash ADC; pulser-peak noise; sample and hold circuits; sliding-scale correction; Circuit noise; Event detection; Feeds; Multiplexing; Noise measurement; Pulse measurements; Radiation detectors; Spectroscopy; Switches; Switching circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2000 IEEE
  • Conference_Location
    Lyon
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-6503-8
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2000.949964
  • Filename
    949964