Title :
A novel high-energy I-131 scatter correction technique which includes correction for gamma camera scatter
Author :
Guy, M.J. ; Flux, G.D. ; Flower, M.A. ; Ott, R.J.
Author_Institution :
Dept. of Phys., R. Marsden Hospital, Sutton, UK
Abstract :
The performance of conventional Triple Energy Window (TEW) scatter correction for high-energy 131I studies can be improved, in some cases, by altering the TEW weighting factors, but this fails to produce the all-round accuracy required. A new energy-window based scatter correction (CSC-Camera Scatter Correction) was used in addition to the TEW method. An energy window was centred at 76 keV and the lead X-rays used to provide angular information about the incident photons. This allowed correction for photons scattered in the collimator. In order to assess CSC and to provide a general 131I imaging analysis tool, a new Monte Carlo package was developed. Its design reflects the increased importance, with respect to low-energy gamma emitters, of camera head interactions for 131I imaging. Applying CSC to experimental point, rod and cylinder phantoms resulted in recovery of the narrow beam attenuation coefficient for 131I of 0.11 cm-1, compared to mean TEW value of 0.09 cm-1. CSC offers improved accuracy for 131I scatter correction, but at the expense of a loss in precision, due to the extra window subtraction
Keywords :
Monte Carlo methods; gamma-ray scattering; medical image processing; radioisotope imaging; 76 keV; I; Pb; collimator; cylinder phantom; energy window; gamma camera scatter correction; high-energy I-131 scatter correction technique; lead X-rays; medical diagnostic imaging; nuclear medicine; point phantom; precision loss; rod phantom; triple energy window scatter correction; Cameras; Electromagnetic scattering; Head; Image analysis; Monte Carlo methods; Optical collimators; Optical imaging; Packaging; Particle scattering; X-ray scattering;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location :
Lyon
Print_ISBN :
0-7803-6503-8
DOI :
10.1109/NSSMIC.2000.950003