• DocumentCode
    3748161
  • Title

    Present status and future prospects of nano-carbon interconnect technologies for LSIs

  • Author

    Yuji Awano

  • Author_Institution
    Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama, Japan
  • fYear
    2015
  • Abstract
    We report on the present status and future prospect of nano-carbon interconnect technologies, consisting of carbon nanotube (CNT) vertical interconnects (vias) and graphene horizontal interconnects, mainly in terms of material growth and fabrication process technologies to meet the requirement of process compatibility with a conventional Si LSI. Their superior electrical properties for replacing Cu interconnects are demonstrated.
  • Keywords
    "Graphene","Conductivity","Silicon","Resistance","Carbon nanotubes","Fabrication","Large scale integration"
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 2015 IEEE International
  • Electronic_ISBN
    2156-017X
  • Type

    conf

  • DOI
    10.1109/IEDM.2015.7409705
  • Filename
    7409705