Title :
ACF-packaged ultrathin Si-based flexible NAND flash memory
Author :
Do Hyun Kim;Hyeon Gyun Yoo;Daniel J. Joe;Keon Jae Lee
Author_Institution :
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST) Daejeon, 305-701, Republic of Korea
Abstract :
In this paper, we demonstrate an ACF-packaged ultrathin Si-based flexible NAND flash memory by adopting a simple method, without using a conventional transfer process. By gently etching the bottom sacrificial silicon of the SOI wafer, flip-chip bonded devices were sufficiently thinned down (roughly to 1 μm) to fabricate highly flexible, fully packaged Si-based NAND flash memory, without any cracks or wrinkles. The work presented here suggests a useful methodology to realize various high-performance, fully packaged Si-based flexible LSI devices.
Keywords :
"Flash memories","Silicon","Substrates","Electrodes","Integrated circuit interconnections","Resistance","Microscopy"
Conference_Titel :
Electron Devices Meeting (IEDM), 2015 IEEE International
Electronic_ISBN :
2156-017X
DOI :
10.1109/IEDM.2015.7409733