• DocumentCode
    3748198
  • Title

    Technology scaling and reliability: Challenges and opportunities

  • Author

    V. Huard;F. Cacho;X. Federspiel;W. Arfaoui;M. Saliva;D. Angot

  • Author_Institution
    STMicroelectronics 850 rue jean monnet 38926 Crolles, France
  • fYear
    2015
  • Abstract
    This paper reviews the challenges in reliability degradation and modeling triggered by the unwavering technology scaling. By an adequate modeling and choice of tools, the challenges can be turn out to opportunities to enhance IPs and products performances through an accurate trade-off with reliability.
  • Keywords
    "Reliability","Degradation","Mathematical model","Human computer interaction","Solid modeling","SPICE","Aging"
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 2015 IEEE International
  • Electronic_ISBN
    2156-017X
  • Type

    conf

  • DOI
    10.1109/IEDM.2015.7409743
  • Filename
    7409743
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3748198