DocumentCode
3748253
Title
Optical performance study of BSI image sensor with stacked grid structure
Author
Yun-Wei Cheng;Tsung-Han Tsai;Chun-Hao Chou;Kuo-Cheng Lee;Hsin-Chi Chen;Yung-Lung Hsu
Author_Institution
FAB 14A, Taiwan Semiconductor Manufacturing Company, 1-1, Nan-Ke North Rd., Tainan Science Park, Tainan City 741-44, Taiwan, R.O.C.
fYear
2015
Abstract
Stacked grid structure is implemented into back-side illumination (BSI) image sensors and device performance for various grid design including dimension and height has been investigated. Simulated angular response shows less quantum efficiency (QE) degradation in large incident angle and SNR-10 has a ~10% improvement for devices with stacked grid structure.
Keywords
"Optical crosstalk","Optical imaging","Optical sensors","Image sensors","Optical filters","Crosstalk","Optical scattering"
Publisher
ieee
Conference_Titel
Electron Devices Meeting (IEDM), 2015 IEEE International
Electronic_ISBN
2156-017X
Type
conf
DOI
10.1109/IEDM.2015.7409801
Filename
7409801
Link To Document