DocumentCode
3748456
Title
Discriminative Learning of Deep Convolutional Feature Point Descriptors
Author
Edgar Simo-Serra;Eduard Trulls;Luis Ferraz;Iasonas Kokkinos;Pascal Fua;Francesc Moreno-Noguer
Author_Institution
Waseda Univ., Tokyo, Japan
fYear
2015
Firstpage
118
Lastpage
126
Abstract
Deep learning has revolutionalized image-level tasks such as classification, but patch-level tasks, such as correspondence, still rely on hand-crafted features, e.g. SIFT. In this paper we use Convolutional Neural Networks (CNNs) to learn discriminant patch representations and in particular train a Siamese network with pairs of (non-)corresponding patches. We deal with the large number of potential pairs with the combination of a stochastic sampling of the training set and an aggressive mining strategy biased towards patches that are hard to classify. By using the L2 distance during both training and testing we develop 128-D descriptors whose euclidean distances reflect patch similarity, and which can be used as a drop-in replacement for any task involving SIFT. We demonstrate consistent performance gains over the state of the art, and generalize well against scaling and rotation, perspective transformation, non-rigid deformation, and illumination changes. Our descriptors are efficient to compute and amenable to modern GPUs, and are publicly available.
Keywords
"Training","Three-dimensional displays","Measurement","Computer architecture","Computer vision","Computational modeling","Semantics"
Publisher
ieee
Conference_Titel
Computer Vision (ICCV), 2015 IEEE International Conference on
Electronic_ISBN
2380-7504
Type
conf
DOI
10.1109/ICCV.2015.22
Filename
7410379
Link To Document