Title :
List mode EM reconstruction of Compton scatter camera images in 3-D
Author :
Wilderman, Scott J. ; Clinthorne, N.H. ; Fessler, J.A. ; Hua, C.-H. ; Rogers, W.
Author_Institution :
Dept. of Nucl. Eng. & Radiol. Sci., Michigan Univ., Ann Arbor, MI, USA
Abstract :
A method has been developed for List Mode EM reconstruction of Compton scattering camera images in 3D, using a previously reported 2-D technique and refining and adapting it to three dimensions. Spatial variation in the system sensitivity is determined by an approximate numerical integration which accounts for solid angle effects, absorption and escape probabilities, and variation in the differential angular scattering cross section. The method for computing the system transition probabilities uses a similar method to determine values in pixels along exact back-projected cones for each detected event, and uses pre-computed values of the inherent system resolution (which includes the effects of spatial and energy measurement resolution and Doppler broadening) to model the response in pixels neighboring the back-projected cone. The algorithm has been parallelized, permitting reconstruction of images using larger number of detected events in relatively constant time by adding additional processors. Results are presented using 3-D simulated data
Keywords :
Compton effect; emission tomography; gamma-ray scattering; image reconstruction; medical image processing; optimisation; 3-D Compton scatter camera images; Doppler broadening; back-projected cone; energy measurement resolution; exact back-projected cones; inherent system resolution; list mode EM reconstruction; medical diagnostic imaging; nuclear medicine; parallelized algorithm; spatial resolution; Biomedical engineering; Cameras; Current measurement; Detectors; Energy resolution; Event detection; Image reconstruction; Maximum likelihood detection; Particle scattering; Spatial resolution;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location :
Lyon
Print_ISBN :
0-7803-6503-8
DOI :
10.1109/NSSMIC.2000.950123